Abstract
This work is based on the method of Monte Carlo simulation and probabilistic inversion for neutron depth profiling. The depth and concentration distribution of boron in a silicon matrix material is calculated. According to NDP experimental configuration at CARR, the energy spectra of a standard sample (SRM2137) are measured and simulated using MCNP and Geant4 software, and the concentration-depth profile of boron in SRM2137 is obtained by adopting an inverse iteration method through MATLAB software. It is shown that the inverse iteration calculation for NDP is feasible.
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