Abstract

Organic photovoltaic cells are partiuclarly sensitive to exciton harvesting and are thus, a useful platform for the characterization of exciton diffusion. While device photocurrent spectroscopy can be used to extract the exciton diffusion length, this method is frequently limited by unknown interfacial recombination losses. We resolve this limitation and demonstrate a general, device-based photocurrent-ratio measurement to extract the intrinsic diffusion length. Since interfacial losses are not active layer specific, a ratio of the donor- and acceptor-material internal quantum efficiencies cancels this quantity. We further show that this measurement permits extraction of additional device-relevant information regarding exciton relaxation and charge separation processes. The generality of this method is demonstrated by measuring exciton transport for both luminescent and dark materials, as well as for small molecule and polymer active materials and semiconductor quantum dots. Thus, we demonstrate a broadly applicable device-based methodology to probe the intrinsic active material exciton diffusion length.

Highlights

  • Organic photovoltaic cells are partiuclarly sensitive to exciton harvesting and are a useful platform for the characterization of exciton diffusion

  • With the photocurrent-ratio method thoroughly vetted against conventional PL approaches for subphthalocyanine chloride (SubPc)-C60, we investigate exciton transport in two dark small molecule materials, boron subnaphthalocyanine chloride (SubNc) and C70 (Fig. 5a)

  • We demonstrate a simple photocurrent-ratio method to measure the intrinsic LD of excitonic semiconductors in bilayer photovoltaic cells

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Summary

Introduction

Organic photovoltaic cells are partiuclarly sensitive to exciton harvesting and are a useful platform for the characterization of exciton diffusion. While device photocurrent spectroscopy can be used to extract the exciton diffusion length, this method is frequently limited by unknown interfacial recombination losses. We further show that this measurement permits extraction of additional device-relevant information regarding exciton relaxation and charge separation processes The generality of this method is demonstrated by measuring exciton transport for both luminescent and dark materials, as well as for small molecule and polymer active materials and semiconductor quantum dots. Since many high-performing active materials are weakly luminescent or dark[7,12,35,37,38], it is essential to develop more general means to accurately probe exciton transport in working devices. Device-based methods are attractive as they probe the LD in a practical environment, as opposed to the often idealized structures utilized for PL measurements This method is applicable to all excitons regardless of photoluminescence efficiency

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