Abstract
Intrinsic ionic centers in solid Xe have been studied using laser-induced fluorescence technique (LIF). Formation of ionic molecular centers has been revealed in the lattice and condition of their stability has been established. To get insight into the electronic structure and the atomic configuration of ionic centers, a set of experiments has been performed employing Ar and Ne matrices doped with Xe at different concentrations. A LIF band at 2.1–2.2 eV has been observed in the solids under excitation within the range of the absorption band of the emitting centers. A correlation between the intensity of the LIF band—nearly identical to the LIF band in pure solid Xe—and the concentration of Xe dimers expected for statistically distributed impurities in matrices has been found. It suggests that the stable ionic centers in the lattice are formed in a configuration similar to the molecular ions Xe+ 2 and the structure of self-trapped and trapped holes resembles that of the dimer ions. The identification of the transitions observed has been suggested.
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