Abstract
用Marx方法(频率为86kc/s及102kc/s)测量了区熔提纯钼单晶及工业纯钼多晶的内耗振幅依赖关系。钼单晶在2000℃氢气炉中退火后可测得Granato-Lücke型的内耗-振幅曲线。微量冷加工后内耗增大,并使内耗振幅曲线上出现转折平台(或称极大值),与铝在低温低振幅下测得的结果相似。根据位错蚀坑的观察结果,初步认为此转折平台的出现是与冷加工在晶体中产生的未被钉扎的新位错有关,并求得转折平台处内耗的增值与新位错密度成正比的关系。此外还做了温度和时效(200—300℃)对内耗振幅曲线的影响,随着温度的降低和时效时间的增长,内耗明显下降。以上的结果我们用推广的GL理论进行了讨论。测量了冷加工对工业纯钼多晶的内耗振幅曲线的影响,基本符合GL理论。
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