Abstract
The total structure factors, S(Q), obtained from high-energy x-ray and neutron diffraction measurements on vitreousSiO2 (v-SiO2) andvitreous GeO2 (v-GeO2) have been analysed by the reverse Monte Carlo (RMC) modelling technique to generate athree-dimensional structural model. The bond angle distributions and the ring size distributionsfrom the model indicated that the sixfold ring and six- and sevenfold rings are dominant inv-SiO2 and v-GeO2, respectively. However, the fraction of threefold rings of Ge inv-GeO2 is larger thanthat of Si in v-SiO2 glass. These features are consistent with the published neutron diffraction and Ramanscattering studies.
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