Abstract
In this work, we demonstrate a simple setup to generate and measure arbitrary vector beams that are tightly focused. The vector beams are created with a spatial light modulator and focused with a microscope objective with an effective numerical aperture of 1.2. The transverse polarization components (Ex, Ey) of the tightly focused vector beams are measured with three-step interferometry. The axial component Ez is reconstructed using the transverse fields with Gauss's law. We measure beams with the following polarization states: circular, radial, azimuthal, spiral, flower, and spider web.
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