Abstract
Insulating resistivity of high mobility dilute two-dimensional holes in GaAs under an in-plane magnetic field exhibits a weak temperature dependence when the carrier density is higher than the critical density of zero-field metal-insulator transition. When the density is below the critical density, the temperature dependence is stronger and exhibits a crossover from the Mott variable range hopping to the Efros-Shklovskii variable range hopping as the field is increased.
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