Abstract
ABSTRACTIn the present study, the effects of soft X-ray irradiation on graphene oxide (GO) films are discussed. In particular, by means of the XPS technique, it has been observed that even with a short exposure time GO is sensitive to the soft x-ray radiation. The X-ray radiation effects were investigated evaluating the C/O atomic ratio. Different irradiation times were applied ranging between 12 and 450 min. Significant modifications were detected in the C/O ratio and consequently in the C1s and O1s XPS profiles. At the highest soft X-ray exposure times, we disclosed the transformation of the C–OH groups to the phenol/aromatic diol ones.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
