Abstract
In this work, the analytical capability of the total reflection X-ray fluorescence technique with the S2 PICOFOX spectrometer was investigated. A set of certified reference materials was prepared as solid particulate for TXRF analysis. Experimental data of sensitivity, limits of detection and recovery for many elements were obtained. Good sensitivity and limits of detection with a good recovery range of around 90–110% were achieved. Thus, the TXRF technique exhibits a good analytical potential for its applicability on different materials.
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