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Abstract
ABSTRACTThe reflection of mid- and near-infrared radiation (400-15000 cm−1 by thin Pt/Al2O3 cermet films was measured using a Fourier transform spectrometer. The data were compared with predictions of three models for the effective optical constants of heterogeneous materials: Maxwell-Garnett, Bruggeman, and a simplified version of a probabilistic growth model due to Sheng. Sheng's model provides the best description of the data over the complete range of metallic volume fraction. This result is expected based on the most likely topology of the films and is in agreement with other work on similar systems at higher frequencies.
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