Abstract
BiFeO3 thin films have been grown on Pt(111)/Ti/SiO2/Si substrates by chemical solution deposition. It is shown that the films are polycrystalline by the measurement of X-ray diffraction. The infrared optical properties of BiFeO3 thin films have been investigated using the infrared spectroscopic ellipsometry in the wavelength range of 2.5 to 12.6 μm. The infrared optical constants of the BiFeO3 thin films are obtained by fitting the measured ellipsometric spectra data using a three-medium model and a classical dielectric function model. The absorption coefficient of BiFeO3 thin films is greater than 100 cm-1 in total measured wavelength region and greater than 1000 cm-1 at the wavelength region above 7.5 μm. It is bigger than that of PbTiO3, Pb(Zr,Ti)O3 and (Pb,La)(Zr,Ti)O3 thin films. It indicates that the BiFeO3 thin films are excellent candidates for infrared detectors.
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