Abstract
We propose expressions allowing to determine the optical constants of thin films, which are not exactly plane-parallel plates but nevertheless exhibit multiple reflection interference patterns in their transmission and reflection spectra. These expressions can be used to determine the index of refraction and the absorption coefficient and their spectral dependence. The method is applied to measurements on thin amorphous films and oriented crystalline films of trans-(CH) x in the infrared region. As final results for the oriented samples we derive values for the refractive index and its anisotropy in the spectral region between 20 μm and 2.5 μm and give absolute values of the absorption intensity of the most prominent IR-active vibrations. The intensity ratios, which are different from values reported in the literature for stretch oriented fibrous trans-(CH) x , and the dichroic behavior of the most important lines are discussed.
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