Abstract
The Alexander–Haasen theory, which describes the deformation kinetics of silicon crystals, has been generalized for impurity crystals. The deformation kinetics of an impurity sample is calculated in a wide range of parameters, including the cases of partial and complete entrainment of impurities by moving dislocations. The developed model, despite its simplicity, adequately describes the qualitative transformation of the stress–strain curves of impurity silicon crystals in dependence of the impurity concentration and other material parameters. The manifestation of negative velocity dependence of the yield stress, observed in natural experiments, is analyzed.
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