Abstract
Thin films of Se1 − xTex (composition x = 0, 0.2, 0.4, 0.6 and 0.8) were obtained by direct thermal evaporation of the bulk compounds. X-ray diffraction and electron diffraction microscopy investigations were carried out on Se1 − xTex films. From X-ray analysis and electron diffraction measurements it was found that the films with x < 0.6 were amorphous at room temperature and when heat treated at 100 °C, the films became crystalline, the degree of crystallinity increasing with increased annealing temperature. For x > 0.6 the as-deposited films were crystalline and the crystallinity increased with increasing Te content. It has been reported that the binary system Se1−xTex has a hexagonal structure. The lattice parameters a and c and the grain size for the annealed films of Se1 − xTex are calculated.
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