Abstract
This paper studies the photoelectrical and structural disorder characteristic of zinc oxide thin films on glass substrates at different annealing temperatures. The ZnO thin films were prepared through cost effective sol‐gel method and spin‐coating technique from zinc acetate in alcoholic solution. The photoelectrical and structural disorder properties were investigated for the thin films annealed at 350∼500° C. The results indicate the improvement of both photoelectrical and structural disorder characteristics of ZnO thin films at higher annealing temperatures.
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