Individual grain orientations and texture development of nanocrystalline electrodeposits showing abnormal grain growth

Abstract

The electron backscatter diffraction (EBSD) technique has been used to determine grain orientations of abnormally grown grains in nanocrystalline Ni electrodeposits upon annealing. The results show that the first grown grains have a 〈3 1 1〉//ND orientation. Upon annealing further grain growth occurs and the preferred alignment of the abnormally growing grains changes from 〈3 1 1〉//ND to 〈1 1 1〉//ND. The subgrain coalescence model adopted from recrystallization is used to describe the occurrence of abnormal grain growth, and energy considerations are put forward for explaining the dominance of the 〈1 1 1〉//ND texture component after longer annealing treatments.