Abstract
Device-level failure probabilities derived from historical, similar radiation datasets can be inputted into a system-level radiation reliability model to provide insight into that system’s failure probability. A linear voltage regulator reliability model that utilizes historical TID (<100 krad(SiO2) and DDD measurements (<9×10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">11</sup> equivalent 1 MeV neutrons/cm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> ) is used as a demonstration system. This methodology aims to reduce engineering uncertainty at early design stages before radiation test data is available, or on quick turn-around projects without radiation test budgets.
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