Abstract
We report an in situ transmission electron microscopy (TEM) imaging of grain growth in aPt nanobridge induced by a high electric current density. The change in morphology at thenanoscale was recorded in real time together with the electrical characterization of the Ptnanobridge. We find a drop in the differential resistance as the voltage across the bridge isincreased; TEM inspection shows that this coincides with thermally induced grain growth,indicating that a reduction of grain boundary scattering is the cause of the resistancedecrease.
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