Abstract
We fabricated the biaxially textured CeO 2 buffer layer using inclined substrate deposition method with and without YSZ buffer layer on Hastelloy and Ni substrates deposited by pulsed laser deposition. The CeO 2 layer without YSZ buffer layer did not show in-plane alignment and YBa 2Cu 3O 7− y (YBCO) film had low critical temperature ( T c). However, the biaxially textured CeO 2 layer deposited on YSZ buffer layer was obtained, and the T c of the YBCO thin film was 84 K. Furthermore in case of using Ni substrate, there were few differences of surface morphology and orientation mechanism with respect to YSZ and CeO 2 buffer layers on Hastelloy and Ni substrate. The YBCO thin film on YSZ and CeO 2 double buffer layers had also similar T c of 85.5 K. On the other hand, the T c of the YBCO film on the CeO 2/Ni was 77.4 K.
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