Abstract
Antiwear films formed from zinc dialkyl-dithiophosphate, in base oil, are known to create inhomogeneous agglomeration of patches on metallic surfaces up to 400 nm thick. It has been found that these patches (termed antiwear pads) are also non-conducting. These two features create difficulties in analyzing data obtained using X-ray photoelectron emission microscopy (X-PEEM). Topography and near-surface charging dominate images obtained using X-PEEM techniques, which can alter electron trajectories and lower signal-to-noise counts. It has been found that the application of a thin continuous platinum coating provides sufficient neutralization to eliminate the positive charge-buildup and improve signal-to-noise. This improves data analysis even with the thickest pads. Examples of charging alleviation and improved signal-to-noise ratios (obtained in the P L-edge spectroscopy) are shown. Furthermore, data analysis of the spectromicroscopy stacks show improved fitting and better polyphosphate distribution mapping for the films.
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