Abstract
We describe the improvements of a Fresnel zone plate (FZP) beam-profile monitor, which is being developed at the KEK-ATF damping ring to measure ultralow emittance electron-beam profiles. This monitor, which is designed to have a submicrometer spatial resolution, is based on x-ray imaging optics composed of two FZPs. Various improvements were performed to the old setup. First, a new crystal monochromator was introduced to suppress the beam image drift. Second, the two FZP folders were improved in order to realize a precise beam-based alignment during x-ray imaging. Third, a fast mechanical shutter was installed to achieve a shorter time resolution, and an x-ray mask system was also installed to obstruct direct synchrotron radiation through the FZPs. These improvements could make beam-profile measurements more precise and reliable. The beam profiles with less than 50 m horizontal beam size and less than 6 m vertical beam size could be measured within a 1 ms time duration. Furthermore, measurements of the damping time and the coupling dependence of the ATF damping ring were successfully carried out with this upgraded FZP monitor.
Highlights
In order to overcome this defect, we proposed a real-time beam-profile monitor based on magnified x-ray imaging optics using ‘‘two’’ Fresnel zone plate (FZP) [13]
III, we show the experimental setup of the FZP monitor, especially the improvements
synchrotron radiation (SR) light is extracted at the bending magnet (BM1R.27) just before the south straight section in the 1.28 GeV Accelerator Test Facility (ATF) damping ring, where the horizontal beam size is expected to be about 50 m and the vertical beam size is expected to be less than 10 m
Summary
The production of low-emittance beams is one of the key techniques for electron accelerators and synchrotron light sources. For precise beam-profile monitoring, it is necessary to know the beam image, which has much information about the horizontal and vertical beam sizes, and the beam positions, beam current, tilt of the beam profile caused by the x-y coupling, and its distribution, by direct monitoring of the beam image in a short time This situation led us to develop a new beam-profile monitor based on x-ray imaging optics by using Fresnel zone plates (FZPs). It has a small spatial resolution of 4 m With this monitor at the SPring-8 storage ring, x-ray images of the electron beam were clearly obtained, and the vertical beam size with 14 m in root mean square (rms) was successfully measured with a 1 ms time duration
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