Abstract
The improvements of a soft x-ray microscope beamline (BL-12) at the SR center of Ritsumeikan University are reported. A wedge-shaped slit and Si plane mirror were newly introduced. The better energy resolution was expected and the +2nd order diffraction from the CZP (1.2 nm at 2.4 nm observation) was suppressed. A new sample holding fixture allows the sample to be replaced quickly and accurately. A new sample cooling system allowed a stable cryogenic x-ray imaging.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
