Abstract
The optimum-performance criteria originally developed for use with six-port reflectometers may, under certain circumstances, be extended to the design of the multistate reflectometer (which utilizes two power detectors to measure the reflection coefficients of microwave components). Test results-from simulations as well as experiments-have confirmed that the novel WR90 multistate instrument proposed in the present paper is able to yield near-optimum performance over the entire waveguide bandwidth.
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