Abstract
AbstractThe degradation of sputtered columnar ZnO layers under DC polarization was studied by using electrochemical impedance spectroscopy and electron microscopy. It was found that the structure of the as‐deposited ZnO film was dense at the nanoscale. An equivalent circuit model including de Levie impedance accounted for the localized propagation of microscale cracks towards the copper substrate. This generates a capacitance (CZnO) that represents the crack surface area in contact with the electrolyte. CZnO is small enough not to be obscured by the double layer capacitance at the top of the layers and increases with increasingly negative potential and time. These results were compared to nanoporous ZnO layers that behave differently and exhibit a large CZnO. The combination of in situ EIS analysis with the ex situ structural information provided by electron microscopy proved to be an efficient methodology to characterize very different microstructures of conductive coatings.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
