Abstract
Zinc oxide-doped forsterite solutions are synthesized through the sol-gel approach by varying the weight percentage of zinc oxide. These solutions are then applied to titanium (Ti) substrates to form zinc oxide-doped forsterite coated Ti substrate samples using the dip-coating method. The structural and surface morphology analyses of the samples are conducted using x-ray Diffraction (XRD) and Scanning Electron Microscope (SEM). Dielectric properties, encompassing dielectric constant, dielectric loss, alternating current conductivity, loss tangent, and relaxation time are explored at room temperature over a frequency range of 200 MHz to 20 GHz utilizing a Vector Network Analyzer (VNA) setup. The impact of zinc oxide on the structure, morphology, and dielectric properties of the samples, particularly in medical implant applications, is extensively discussed. The results indicate that samples with a higher weight percentage of zinc oxide demonstrate superior dielectric characteristics.
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