Abstract
Monolithic high contrast gratings (MHCGs) composed of a one-dimensional grating patterned in a monolithic layer provide up to 100% optical power reflectance and can be fabricated in almost any semiconductor and dielectric material used in modern optoelectronics. MHCGs enable monolithic integration, polarization selectivity, and versatile phase tuning. They can be from 10 to 20 times thinner than distributed Bragg reflectors. The subwavelength dimensions of MHCGs significantly reduce the possibility of ensuring the smoothness of the sidewalls of the MHCG stripes and make precise control of the shape of the MHCG stripe cross-section difficult during the etching process. The question is then whether it is more beneficial to improve the etching methods to obtain a perfect cross-section shape, as assumed by the design, or whether it is possible to find geometrical parameters that enable high optical power reflectance using the shape that a given etching method provides. Here, we present a numerical study supported by the experimental characterization of MHCGs fabricated in various materials using a variety of common surface nanometer-scale shaping methods. We demonstrate that MHCG stripes with an arbitrary cross-section shape can provide optical power reflectance of nearly 100%, which greatly relaxes their fabrication requirements. Moreover, we show that optical power reflectance exceeding 99% with a record spectral bandwidth of more than 20% can be achieved for quasi-trapezoidal cross-sections of MHCGs. We also show that sidewall corrugations of the MHCG stripes have only a slight impact on MHCG optical power reflectance if the amplitude of the corrugation is less than 16% of the MHCG period. This level of stripe fabrication precision can be achieved using the most current surface etching methods. Our results are significant for the design and production of a variety of photonic devices employing MHCGs. The flexibility with regard to cross-section shape facilitates the reliable fabrication of highly reflective subwavelength grating mirrors. This in turn will enable the manufacture of monolithically integrated high-quality-factor optical micro- and nanocavity devices.
Highlights
Monolithic high contrast gratings (MHCGs) composed of a one-dimensional grating patterned in a monolithic layer provide up to 100% optical power reflectance and can be fabricated in almost any semiconductor and dielectric material used in modern optoelectronics
We have shown that MHCG stripes do not need to have perfectly rectangular or even symmetric cross-sections to provide optical power reflectance close to 100%
This greatly relaxes the requirements on the fabrication of MHCG mirrors, which can be made from almost any semiconductor material used in optoelectronics
Summary
Smaller than or equal to the bottom base and which is symmetrical with respect to the y-axis (Figure 10a). A single period with corrugated walls and periodic boundary conditions was capable of providing 100% reflectance provided the parameters of the grating were chosen properly This extends the conclusions presented in Influence of Cross-Sectional Shape on the Maximal Power Reflectance of the MHCG, showing that corrugations along the x-axis, if they recur periodically in subsequent stripes, do not deteriorate the reflectivity. With a corrugation amplitude of 130 nm (which corresponds to 40% of the stripe width and to 16% of the MHCG period), we observe a reduction in reflectivity from 1 to 0.99 and narrowing of the reflection spectrum by 50 nm for an optical power reflectance of 0.98 Such severe corrugations were not observed in the gratings fabricated using standard processing methods discussed in this paper.
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