Abstract
Mass transport phenomenon was investigated for the oxidation of Fe–Cr alloy in CH 4–H 2O at 1073 K. Grain boundary diffusion of elements was visualized around the oxide scale/alloy interfaces by secondary ion mass spectrometry (SIMS) imaging analysis. The distributions of elements on the oxide scale and alloy were analyzed in an area of 150 μm in diameter. The SIMS images show high concentration of Mn at the grain boundary. The depth profiles at the grain boundary from the images of Cr and Mn show high and constant concentration, suggesting fast diffusion of these elements. On the other hand, depth profiles at the bulk of the alloy show a specific distribution of each element from surface to inner of the scale: Mn–Fe–(Cr)-rich oxide, Cr 2O 3-rich, and SiO 2-rich layers and alloy bulk with Al 2O 3 as internal oxides. The growth mechanism and scale formation kinetics are discussed.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
