Abstract
We demonstrate the electrical performances of the quaternary InAlGaN/GaN MIS-HEMTs with high quality SiNx gate dielectric and surface passivation layer deposited by low pressure chemical vapor deposition (LPCVD) at 780.C. Excellent LPCVD-SiNx/InAlGaN interface and SiNx film quality were obtained, resulting in very high output current density, a very small threshold voltage hysteresis and steep subthreshold slope. The LPCVD-SiNx/InAlGaN/GaN MIS-HEMT device exhibited high on/off current ratio, large gate voltage swing, high breakdown voltage, and very low dynamic on-resistance (RON) degradation, meaning effective current collapse suppression compared to the plasma enhanced chemical vapor deposition -SiNx/InAlGaN/GaN MIS-HEMTs. The corresponding specific on-resistance (RON,sp) for LPCVD-SiNx device was as low as 0.98 mEcm2, yielding a high figure of merit of 737 MW/cm2. These results demonstrate a great potential of the LPCVD-SiNx/InAlGaN/GaN MIS-HEMTs for high-power switching applications.
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