Abstract
The ability to directly correlate electron energy loss spectroscopy (EELS) with Z-contrast images in the scanning transmission electron microscope (STEM) provides a powerful tool to characterize nanoscale materials. The incorporation of a monochromator into the FEI Tecnai F20 UT at the National Center for Electron Microscopy (NCEM) extends the power of these techniques by increasing the sensitivity of core-loss spectra to small changes in fine-structure and by allowing the low-loss region of the spectrum to be analyzed in detail. Here, the configuration of the monochromated Tecnai will be discussed and examples of spectra obtained utilizing the highest spatial and energy resolution will be presented [1].
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