Abstract
Application of atomic force microscopy (AFM) to polymers includes visualization of single macromolecules, studies of lamellar and micro-phase morphologies, and compositional imaging of heterogeneous materials using phase contrast. The essential issues of high-resolution imaging, compositional mapping polymers, and AFM-based nanoindentation will be outlined. Recent developments in multi-frequency AFM impact local studies of nanomechanical and electric properties, the recording of force curves in oscillatory AFM modes, and single-pass Kelvin force microscopy (KFM) and dC/dZ measurements. The latest applications of KFM and dC/dZ mapping to heterogeneous polymers with polar components will be presented.
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