Abstract
Field emission microscopy, field ion microscopy and scanning tunneling microscopy realized atomically high resolutions utilizing electron tunneling and confining a tunneling region into an atomically small spot. These microscopies have other unique features: the energy analyses of tunneling electrons by a field emission microscope (FEM) and a scanning tunneling microscope (STM), i.e., field emission electron spectroscopy (FEES) and scanning tunneling spectroscopy (STS), respectively, and the mass analysis of individual surface atoms by a combined instrument of a field ion microscope (FIM) and a mass spectrometer, the atom-probe (A-P). FEES and STS provide information on the electronic states of specimen surfaces and the A-P clarifies the surface composition in atomic dimensions. The present study suggests that the unification of A-P/FEES and STM/STS would lead to a new approach for reliable ultramicroscopic analysis of solid surfaces.
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