Abstract
An imaging position sensitive, particle beam detector is described which is minimally invasive, operates over a wide dynamic range (>107), and exhibits high spatial resolution. The detector images secondary electrons or ions produced when an energetic particle beam passes through a thin foil. These secondary electrons or ions are transported onto a two dimensional imaging detector using stigmatic ion optics. The detector has been employed as a tuning aid for the Ion Microtomography (IMT) system at Sandia National Laboratories and its performance in this application will be discussed.
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