Abstract
A method for the Faraday rotation angle measurement in RFX is described, which does not require an interferometric structure, resulting in a considerable simplification of the diagnostic apparatus. It incorporates the same principle of operation as is employed in a high resolution polarimeter for visible wavelengths. The test on the bench performed at the Far Infrared wavelength of interest (λ=118.8 μm) is described, the results which were obtained are presented and discussed, and the feasibility of the method has been clearly demonstrated.
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