Abstract
Bi 2Sr 2CaCu 2O 8+δ thin films were irradiated with 200 MeV 40Ca, 1162 MeV and 2640 MeV 197Au and 1404 MeV 238U ions. The radiation-induced defects in the films were investigated with high resolution electron microscopy (HREM) both in cross-section and in-plane view. The HREM study shows that swift heavy ions produce well defined latent columnar tracks consisting of totally amorphized material divided by a sharp transition from the surrounding crystalline material. In-situ measurements of the transport critical current density J c on a single sample irradiated first with Ca then with Au ions were performed. Correlations of the transport measurements with HREM data show clearly that continuous columnar defects ( 197Au, 238U) are more efficient pinning centers than scattered defect cascades ( 40Ca).
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