Abstract
The review is devoted to application of synchrotron radiation (SR) for studying the structure of polycrystalline materials. The main emphasis is made on the equipment and techniques for acquiring high precision structural information — high angular resolution powder diffractometry and the use of anomalous scattering effect in structural studies. Various schemes of recording the high resolution X-ray patterns are presented, diffractometers operating in the world’s leading synchrotron radiation centers are described, and examples of particular applications are reported.
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