Abstract
Continuous series of solid solutions x.SrTiO3-(l-x).PbZr0.52Ti0.48O3 (SPZT) have been grown by pulsed laser deposition technique onto La0.7Sr0.3CoO3/Al2O3(0112) single crystal. Films properties have been characterized in Au/SPZT/La0–7Sr0.3CoO3(LSCO)/Al2O3 vertical capacitive cell. X-ray diffraction shows SPZT/LSCO bilayer grows in strict epitaxial relationship with sapphire substrate: Display Equation LSCO layer was found to be tensile strained, while SPZT film experiences tetragonal distortions c/a −1 ≈ 0.86% which are much lower than 2.73% in pure PZT ceramics. Curie temperature in SPZT film has been tailored continuously in the explored temperature range 77 K to 400 K by controlling SrTiO3:PZT ratio. Processing parameters have been optimized to get the highest tenability factor . SrTiO3:PZT=83:17 film exhibits superior properties: at 1 kHz maximum dielectric permittivity and minimum loss tanδ were found to be 870 and 0.005, respectively; while K-factor exceeds value of 60 in the temperature range 280 to 350 °C reachingthe maximum value of 64 at 325 °C. SPZT films can withstand prolonged pre-breakdown electric field and has resistivity as high as 3.5 1012 Ω cm at 186 kV/cm.
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