Abstract

As a crucial element in photovoltaic power generation systems, the condition of solar panels significantly impacts the efficiency of power generation. The ability to accurately and promptly detect defects in solar panels is essential for enhancing system performance. This study introduces a novel model for identifying defects in photovoltaic modules, leveraging an enhanced version of EfficientNet-V2. This model aims to address challenges in identifying defects in infrared images of solar panels under conditions of high-noise and low-model efficiency. To address the challenges of high image noise and blur, this article initially presents a methodology that combines the Db4 wavelet transform with a blind deconvolution algorithm for comprehensive preprocessing of the original image. Furthermore, this study optimizes the model's feature representation capabilities by implementing key transformations within the EfficientNet-V2 network framework. Notably, we replaced the traditional SE block with the more efficient channel attention (ECA) mechanism module. Due to its lightweight structure and effective performance, ECA substantially improves the model's capacity to extract complex and abstract image features, while also accelerating the training process's convergence speed and enhancing overall computational efficiency. At the classifier level, this paper innovatively integrates the XGBoost ensemble learning algorithm into the model, substituting the conventional softmax classifier used in traditional convolutional neural network (CNN). With its superior generalization capabilities, robust nonlinear modeling skills, and efficient computational characteristics, XGBoost can more accurately detect minute defects in solar panels based on the deep features produced by EfficientNet-V2, thereby significantly improving the accuracy and robustness of defect detection. Simulation results demonstrate that the proposed model structure outperforms traditional CNN models in terms of accuracy and stability, underscoring the efficacy of the enhanced EfficientNet-V2 model in detecting solar panel defects under high-noise conditions.

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