Abstract
The growth units of superconducting Bi–Sr–Ca–Cu–O thin films were examined. The films were prepared on Y3Al5O12 (YAG) single-crystal substrates by metalorganic chemical vapor deposition (MOCVD). The growth process of the films at the initial stage was investigated by cross-sectional high-resolution transmission electron microscopy (HREM) and atomic force microscopy (AFM). We found evidence of half-unit cell growth, and the top layer of the half-unit was determined to be a Bi–O layer by angular-resolved measurement using X-ray photoelectron spectroscopy (XPS).
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
