Abstract

AbstractIn our work, large diameter ZnTe single crystals were grown by various melt growth methods. By a liquid encapsulated vertical gradient freezing method, crystals with large grains and low dislocation density were obtained. By a liquid encapsulated Kyropoulos method, 80 mm diameter crystals were successfully grown from ZnTe seed crystals. However, crystals grown by the both methods had large strain and cracks owing to difference in coefficient of thermal expansion between an encapsulant and ZnTe. Therefore, a new crystal growth method was developed. Two crucibles were used in the new method. It was named double crucible liquid encapsulated pulling method. Crystals up to 100 mm in diameter and 40 mm in length were reproducibly obtained. Both <100> and <110> crystals were successfully grown. The etch pit density of the grown crystal was lower than 10,000 cm–2 and any large strain or cracks were not observed. In order to reduce Te inclusions, wafer annealing was examined. Most Te inclusions were eliminated with suitable Zn pressure and annealing temperature. Optical transparency of the ZnTe crystal increased after annealing. This is because scatter of the incident light by Te inclusions decreased. (© 2014 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

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