Abstract
On the electron-doped superconductor of Nd2−xCexCuO4−y (NCCO) thin film, the presence of non-c-axis oriented grains, which are identified as (110) reflection peak at 2θ = 32.5∘ in the x-ray diffraction (XRD) spectrum is always observed. Meanwhile, high quality thin films without having impurities are necessary for device applications. We study the growth of NCCO thin film prepared by pulsed laser deposition technique and found that the volume fraction of (110) oriented grains depends on the laser fluence. With the laser fluence of around 2.2 J/cm2, NCCO thin film, which is free from the presence of non-c-axis oriented grains, could be obtained. The atomic force microscope images show that with the absence of (110) oriented grain the c-axis oriented grains grow into rectangular shape with a spiral growth mode. The rocking curve measurement for (004) peak give a full width at half maximum value of 0.12∘, which confirms the superior quality of the film and this film has superconducting critical temperature (Tc) at 21 K with a transition width (ΔTc) of 1 K.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of Materials Science: Materials in Electronics
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
