Abstract
We have studied the crystal growth and degradation of sequential physical vapor deposited thin methylammonium lead tri-bromide (MAPbBr3) perovskite films on glass, aluminum (Al), tin (Sn), silver (Ag), gold-zinc (Au-Zn), and gold (Au) substrates. The structural and morphological properties of the MAPbBr3 were observed as-deposited and 60 days later. X-ray diffractograms of as-deposited films on glass confirmed a cubic MAPbBr3 structure with Pm3¯m space group. However, different crystallographic textures occurred on the metals, and a significant (200) preferred orientation was observed on Sn. The extent of degradation of MAPbBr3 was variable, and each decay led to a significant reduction in crystallite size and change in micro-strain from tensile to compressive. Significant percentage loss in crystallite size occurred the most on Al and least on Au-Zn. Field-emission scanning electron micrographs of the as-deposited films showed compact and bimodal distributed grains. The average grain size increased linearly with the work function of the metals, from 294 nm for Al to 850 nm for Au. Grains remained attached on Sn, Ag, Au-Zn, and Au substrates for 60 days but quickly delaminated on the Al substrate. These findings shed light on possible metal/MAPbBr3 interface interactions for a stable charge transport layer-free MAPbBr3 device structure.
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