Abstract
Lead sulfide (PbS) films have been deposited by chemical deposition on a glass substrate. Microstructure characterization was carried out by X-ray diffraction and scanning electron microscopy in order to determine the average crystallite size (15 nm) and study the surface morphologies of the as-deposited and heat-treated films. The PbS films obtained had p-type conductivity and low resisitivity (5 Ω cm). The carrier density, Hall mobility and mean free path of carriers in PbS films were in the range 2.5×10 17 cm −3, 5 cm 2/V s and 0.642 μm, respectively.
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