Abstract
The microstructure of the grain boundaries and solute segregation are studied for 0.3 mol%CuO doped 3 mol% yttria-stabilized zirconia (3Y-TZP) using TEMs equipped with EDS and EELS. The observations revealed grain boundaries of various thickness ranging from a sharp boundary without any extra phase to those with amorphous-like phase, of up to 2 nm thickness, in between. There were also pockets filled with amorphous-like phase at the triple junctions of g grain boundaries. Segregation of Cu and Y were observed not only in these amorphous-like regions but also along sharp grain boundaries without any extra phase.
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