Glovebox-integrated XES and XAS station for in situ studies in tender x-ray region

Abstract

X-ray emission spectroscopy (XES), as a complementary technique to x-ray absorption spectroscopy (XAS), is powerful in the analysis of the electronic structure of the materials by probing the occupied density of states with high energy resolution. Recently, an XES spectrometer optimized for the tender x-ray region (2–5 keV) was successfully installed into an inert atmosphere glovebox, and the entire system was successfully integrated into the SXRMB (soft x-ray microcharacterization beamline) at the Canadian Light Source. Here, the technical design and the performance of the SXRMB XES-integrated glovebox station is presented. High energy resolution of ∼1 eV or better has been achieved for the spectrometer in the tender energy x-ray ranges. Capability of the station for in-situ XES and XAS measurements is demonstrated using an example of phosphorus phase transformation in phosphorus anodes for lithium-ion battery research.