Abstract
Two methods are compared experimentally and theoretically: surface electromagnetic wave spectroscopy (SEWS) and infrared reflection-absorption spectroscopy (IRAS) at the angle of incidence 88°. On the example of the 4-n-octadecylphenol Langmuir films on copper it was shown that the sensitivity of SEWS is about one order greater than that of IRAS, the ratio of sensitivities growing with the increase of the film thickness. A Fourier-spectrometer for broad band IR spectra measurements was used.
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