Abstract
<p>The paper aims at proposing test methods for Analog-to-Information Converters (AICs).</p><p>In particular, the objective of this work is to verify if figures of merit and test methods, currently defined in standards for traditional Analog-to-Digital Converters, can be applied to AICs based on the random demodulation architecture.</p><p>For this purpose, an AIC prototype has been designed, starting from commercially available integrated circuits. A simulation analysis and an experimental investigation have been carried out to study the additional influencing factors such as the parameters of the reconstruction algorithm. Results show that standard figures of merit are in general capable of describing the performance of AICs, provided that they are slightly modified according to the proposals reported in the paper. In addition, test methods have to be modified in order to take into account the statistical behavior of AICs.</p>
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