Abstract
The conventional model of the processes occurring in the course of a p–n-junction's partial avalanche breakdown has been analyzed in this paper. Microplasma noise spectra of industrially produced LEDs were compared with those predicted by the model. It was established that the data obtained experimentally on reverse-biased LEDs could not be described in terms of this model. The degree to which the fractal properties were pronounced was shown to be variable by changing the reverse voltage. The discovered fractal properties of microplasma noise can serve as the basis for further studies which are bound to explain the breakdown characteristics of real LEDs and to correct the conventional model of p–n-junction's avalanche breakdown.
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