Abstract
This study discusses changes in the value of fractal parameters determined based on functions of structure S(t), generated in different directions of anisotropy of the examined surfaces. The analyzed material consisted of AFM calibration standards TGT1, PG and TGZ1 which were used as models of strongly isotropic and anisotropic surfaces. The topography of the examined surfaces was imaged by atomic force microscopy. The obtained results indicate that all surfaces can be described mathematically to identify fractal parameters in any anisotropic direction.
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