Abstract
The field step dependence of remanence and δM curves has been measured in a CoPtCrB thin film and a γ-Fe2O3 tape. When the dc-demagnetization curve is measured with a saturation field applied before each reverse field, δM increases with decreasing field step. This effect is directly linked to viscosity effects that exist in the isothermal remanence curve that increase with the number of field steps. The essential features of the observed field step dependence are confirmed by calculations based on a Stoner-Wohlfarth, Arrhenius–Néel model.
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