Abstract
Field emission has proven to be a very useful technique for obtaining work function changes from single crystal planes or from the whole emitter. The inability to independently measure the electric field has limited the accuracy of field emission total current measurements for determining absolute work functions. Young and Clark's method of combining field emission energy distribution measurements and total current versus voltage measurements to eliminate the electric field as an unknown is not adequate because it does not take into account the effects of the surface density of states present in the energy distribution. In this paper we discuss a technique to overcome this problem, which involves a series of measurements taken as a function of electric field and an extrapolation to zero field. The method yields reliable values of the work function for the low index (flat) (100) and (112) planes of tungsten but not for the high index (rough) (013) and (111) faces.
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